Test and Evaluation

HYPRES is also equipped with an evaluation laboratory with three RF shielded rooms, cryogenic probes, and extensive test equipment for testing high-speed and high-sensitivity circuits. The company can also test its circuits in commercial closed cycle refrigerators (cryocoolers) without the need for liquid Helium. HYPRES has several test stations equipped with oscilloscopes, signal generators and low-noise current sources for testing superconductor integrated circuits.

HYPRES will also use the OCTOPUX multifunctional test system, which is capable of performing exhaustive tests of large digital and analog circuits. OCTOPUX features 64 regular I/O channels, 32 auxiliary read-only channels, high-accuracy voltage measurements and at 400Hz for low frequency functional testing. This system allows the company to apply simultaneous regulated dc power supplies to several circuits, extract resistance matrices and resistance trees, perform real-time power analysis of generated signals, generate test patterns and analyze digital response, and calculate one- and multi-dimensional parameter windows (margins).

For testing of superconductor and cryogenic semiconductor chips, HYPRES has a wide variety of general-purpose immersion probes for testing down to 4 K in a liquid Helium dewar. The probes have a set of long coaxial cables and a termination block with a circuit board for distributing signals to the chip-under-test. These include six (6) 80-pin probes for 1-cm x 1-cm chips and four (4) 40-pin probes for 5-mm x 5-mm chips. Another 80-pin variable-temperature dual-mode probe allows testing in He vapor or liquid in a dewar, as well as with a cryocooler.

The team can also test components over a wide temperature range in a cryocooled test-bed. These cryocooled test-beds were originally developed to enable testing of different superconductor chips for a variety of digital-RF receiver applications (e.g. SATCOM, SIGINT, Tactical Communications) with the Sumitomo two-stage GM (RDK-101D) cryocooler. However, these versatile test-beds are extremely useful for evaluation of various electronic components (e.g. analog filters, low-noise amplifiers) at temperatures ranging from 4 to 80 K, as well as different cryopackaging components (e.g. high-temperature superconductor cables, heat switches).